Yield analysis

The module supports data query and analysis based on days, weeks, months, and custom time periods, as well as data query and analysis based on conditions such as factories, products, process routes, process, process step, and inspection equipment.

Support the selection of the Lot/Wafer to be analyzed, support the statistical yield summary report according to the selected Lot/Wafer, and support the display of the yield trend chart of the work-in-process according to the time period selected.